Electrical Study on PI and PI+ITO+GO Polymeric Composite Thin Films
نویسندگان
چکیده
منابع مشابه
Structural Morphological and Electrical Study On PI/ ITO/ PVDF Ternary Composite Thin Films
Studies of polymeric ternary composite thin films incorporating inorganic materials are of immense importance for current technological applications. Polyimide (PI) composite thin films incorporating indium tin oxide (ITO) and poly (vinlylidene fluoride) (PVDF) at various weight ratios were processed using an in situ generation approach with the spin coating unit. The resultant product was oxid...
متن کاملStudy of Electrical Properties of Thin Metal Films and Composite Films Near the Percolation Threshold II
In this contribution electrical transport and morphological properties of composite structures studied by the help of computer experiment are presented. The structures generated by the hard-sphere model embody tunnel mechanism of conductivity and the classical terms of the percolation theory are redefined. Correlations between electric transport and morphological properties of these structures ...
متن کاملPolymeric nanostructured composite films*
This research news describes the construction of polymeric nanostructured composite film based on a variety of interactions, such as hydrophobic–hydrophilic effect, electrostatic interaction, hydrogen bonding, etc. The work focused on developing strategies to solve the basic problems in the area of ultrathin film research, such as stability, improving the interface quality, creating patterned i...
متن کاملIrradiation induced electrical conductivity in polymeric thin films
Scientific objectives of this project are: (1) To produce and characterise uniaxially charge conducting ion tracks in thin polymeric films with high energy ion beam irradiation. (2) To understand the charge transport mechanisms within and as well as across ion tracks, which have been identified and shown to occur via electron transport across the carbon clusters that were formed within these io...
متن کاملA study on the dependence of DC electrical properties and nanostructure of Cu thin films on film thickness
This paper reports the correlation between film thickness, nanostructure and DC electrical properties of copper thin films deposited by PVD method on glass substrate. X-ray diffraction (XRD) and atomic force microscopy (AFM) were used for crystallography and morphology investigation, respectively. Resistivity was measured by four point probe instrument, while a Hall effects measurement system w...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: International Journal for Research in Applied Science and Engineering Technology
سال: 2020
ISSN: 2321-9653
DOI: 10.22214/ijraset.2020.32347